SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Defines the rapid change of temperature test method and the two-fluid-bath method.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-21 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType	Standard
Pages	16
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749 : 2000 AMD 2 2004

Standards	Relationship
IEC 60749-11:2002	Identical
EN 60749-11:2002	Identical

IEC 60749-3:2017	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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CEI EN 60749-11 : 2004

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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