SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-23 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType	Standard
Pages	12
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749 : 2000 AMD 2 2004

Standards	Relationship
IEC 60749-13:2002	Identical
EN 60749-13:2002	Identical

IEC 60068-2-11:1981	Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
EN 60068-2-11:1999	Environmental testing - Part 2: Tests - Test Ka: Salt mist
IEC 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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CEI EN 60749-13 : 2004

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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