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CEI EN 61747-6-3 : 2012

CEI EN 61747-6-3 : 2012

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LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations
5 Standard measuring conditions
6 Standard motion-blur measuring
  methods
7 Test report
Annex A (informative) - Subjective
        test method
Annex B (informative) - Motion
        contrast degradation
Annex C (informative) - Dynamic
        modulation transfer function
Bibliography
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Describes procedures for quality assessment related to the motion performance of LCDs. It defines artifacts in the motion contents and methods for motion artifact measurement.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-97. (08/2012)
DocumentType
Standard
Pages
32
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 61747-6-3:2011 Identical
EN 61747-6-3 : 2011 Identical

IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
ISO 11664-4:2008 Colorimetry Part 4: CIE 1976 L*a*b* Colour space
IEC 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
EN 61747-6:2004 Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type
IEC 61747-6:2004 Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type

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