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CEI EN 61967-2 : 2006

CEI EN 61967-2 : 2006

Current

Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC emissions reference levels
Annex A (informative) - Example calibration & set-up
        verification sheet
Annex B (informative) - TEM cell and wideband TEM
        cell descriptions
Annex C (informative) - Calculation of dipole moment
        from measured data
Annex D (informative) - Specification of emissions
        data
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their corresponding
         European publications

Specifies a method for measuring the electromagnetic radiation from an integrated circuit (IC).

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-48. (08/2006)
DocumentType
Standard
Pages
30
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 61967-2:2005 Identical
EN 61967-2:2005 Identical

IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
CISPR 16-2-2:2010 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-2: Methods of measurement of disturbances and immunity - Measurement of disturbance power
IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements
CISPR 16-1-1:2015 Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus
CISPR 16-1-3:2004+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power
CISPR 16-2-1:2014 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-1: Methods of measurement of disturbances and immunity - Conducted disturbance measurements
CISPR 16-2-4:2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-4: Methods of measurement of disturbances and immunity - Immunity measurements
IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
CISPR 16-2-3:2016 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-3: Methods of measurement of disturbances and immunity - Radiated disturbance measurements

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