CEI EN 61967-4 : 2009
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
Hardcopy , PDF
English
01-01-2009
FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) - Probe calibration procedure
Annex B (informative) - Classification of conducted
emission levels
Annex C (informative) - Example of reference levels
for automotive applications
Annex D (informative) - EMC requirements and how
to use EMC IC measurement techniques
Annex E (informative) - Example of a test set-up
consisting of an EMC main test board and
EME IC test board
Annex F (informative) - 150 ohm direct coupling networks
for common mode emission measurements of
differential mode data transfer ICs and similar
circuits
Annex ZA (normative) - Normative references to
international publications with their corresponding
European publications
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