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CEI EN 61988-2-5 : 2013

Current
Current

The latest, up-to-date edition.

PLASMA DISPLAY PANELS - PART 2-5: MEASURING METHODS - ACOUSTIC NOISE
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2013

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Structure of measuring equipment
5 Standard measuring conditions
6 Measuring method
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes the methods for characterizing the performance of PDP modules (plasma display modules): Acoustic noise.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-105. (07/2013)
DocumentType
Standard
Pages
18
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 61988-2-5:2012 Identical
EN 61988-2-5 : 2012 Identical

IEC 61988-1:2011 Plasma display panels - Part 1: Terminology and letter symbols
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
EN 61988-1:2011 Plasma display panels - Part 1: Terminology and letter symbols
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
EN 27574-1 : 1988 ACOUSTICS - STATISTICAL METHODS FOR DETERMINING AND VERIFYING STATED NOISE EMISSION VALUES OF MACHINERY AND EQUIPMENT - GENERAL CONSIDERATIONS AND DEFINITIONS
EN 61988-4 : 2007 PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS
IEC 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
IEC 61988-3-1:2005 Plasma display panels - Part 3-1: Mechanical interface
ISO 7574-1:1985 Acoustics — Statistical methods for determining and verifying stated noise emission values of machinery and equipment — Part 1: General considerations and definitions
IEC 61988-4:2007 Plasma display panels - Part 4: Climatic and mechanical testing methods
EN 61672-1:2013 Electroacoustics - Sound level meters - Part 1: Specifications
EN 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical

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