• There are no items in your cart

CEI EN 62433-4 : 1ED 2017

Current
Current

The latest, up-to-date edition.

EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI)
Published date

07-19-2017

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICIM-CI model description
6 CIML format
7 Extraction
8 Validation of ICIM-CI hypotheses
9 Model usage
Annex A (normative) - Preliminary definitions for XML
        representation
Annex B (informative) - ICIM-CI example with disturbance
        load
Annex C (informative) - Conversions between parameter types
Annex D (informative) - Example of ICIM-CI macro-model
        in CIML format
Annex E (normative) - CIML Valid keywords and usage
Annex F (informative) - PDN impedance measurement methods
        using vector network analyzer
Annex G (informative) - RFIP measurement method description
Annex H (informative) - Immunity simulation with ICIM model
        based on pass/fail test
Annex I (informative) - Immunity simulation with ICIM model
        based on non pass/fail test
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Defines a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC).

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-137. (07/2017)
DocumentType
Standard
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 62433-4:2016 Identical
EN 62433-4:2016 Identical

EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
ISO/IEC 646:1991 Information technology ISO 7-bit coded character set for information interchange
CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.