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DD IEC/TS 62228:2007

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Integrated circuits. EMC evaluation of CAN transceivers
Available format(s)

Hardcopy , PDF

Superseded date

09-18-2023

Language(s)

English

Published date

03-30-2007

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Measurements and tests
  4.1 General
  4.2 RF and transient tests
  4.3 ESD
5 Test report
Annex A (informative) Test circuit boards
Annex B (informative) Documentation of test results
Bibliography

Describes test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers.

Specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - immunity against RF common mode disturbances on the signal lines - emissions caused by non-symmetrical signals regarding the time and frequency domain - immunity against transients (function and damage) - immunity against electrostatic discharges - ESD (damage)

Committee
EPL/47
DocumentType
Standard
Pages
46
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
IEC TS 62228:2007 Identical

IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
ISO 7637-2:2011 Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
IEC 61000-4-2:2008 Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

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PDF - English
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