DIN EN 50132-5 : 2002

Introduction
1 Scope
2 Normative references
3 Definitions and abbreviations
   3.1 Definitions
   3.2 Abbreviations
4 Requirements
   4.1 General
   4.2 Video input and output
   4.3 Insertion gain
   4.4 Bandwidth and frequency response
   4.5 Signal to noise ratio
   4.6 Interference
   4.7 Luminance non-linearity
   4.8 Chrominance to luminance gain inequality
   4.9 Chrominance to luminance delay inequality
   4.10 Differential gain
   4.11 Differential phase
   4.12 Environmental conditions
   4.13 Electro-magnetic radiation
   4.14 Immunity to electro-magnetic interference
   4.15 Electrical safety
5 Test conditions
   5.1 Introduction
   5.2 Test equipment
   5.3 Laboratory conditions
6 Performance tests
   6.1 Input and output signal levels
   6.2 Insertion gain
   6.3 Input and output impedance
   6.4 DC voltage at the output
   6.5 Short time waveform distortion
   6.6 Line time waveform distortion
   6.7 Field time waveform distortion
   6.8 Damped low frequency distortion
   6.9 Chrominance to luminance gain and delay
       inequality
   6.10 Signal to noise ratio
   6.11 Interference
   6.12 Luminance non-linearity
   6.13 Differential gain
   6.14 Differential phase
7 Environmental testing
   7.1 Introduction
   7.2 Selection of tests and severity
   7.3 Dry heat (operational)
   7.4 Dry heat (endurance)
   7.5 Cold (operational)
   7.6 Damp heat, steady state (operational)
   7.7 Damp heat, steady state (endurance)
   7.8 Damp heat, cyclic (operational)
   7.9 Damp heat, cyclic (endurance)
   7.10 Water ingress (endurance)
   7.11 Sulphur dioxide (SO2) (endurance)
   7.12 Salt mist, cyclic (endurance)
   7.13 Shock (operational)
   7.14 Vibration, sinusoidal (endurance)
8 Documentation
9 Marking and labelling
Annex A (normative) Test patterns
      A.1 Signal A
      A.2 Signal B
      A.3 Signal C
      A.4 Signal D
      A.5 Signal F
Annex B (normative)
      B.1 Chrominance to luminance amplitude and
          delay errors
      B.2 The Rosman nomogram
      B.3 Damped low frequency distortion
      B.4 2T waveform mask