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DIN ISO 24173:2013-04

Current

Current

The latest, up-to-date edition.

MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION (ISO 24713:2009)

Available format(s)

Hardcopy , PDF

Language(s)

German, English

Published date

04-01-2013

National foreword
National Annex NA (informative) - Bibliography
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment for EBSD
5 Operating conditions
6 Calibrations required for indexing of EBSPs
7 Analytical procedure
8 Measurement uncertainty
9 Reporting the results
Annex A (informative) - Principle of EBSD
Annex B (normative) - Specimen preparation for EBSD
Annex C (informative) - Brief introduction to crystallography
        and EBSP indexing, and other information useful for
        EBSD
Bibliography

Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD).

Committee
TC 202
DocumentType
Standard
Pages
48
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current

Standards Relationship
ISO 24173:2009 Identical

DIN ISO 13067:2015-12 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
SAC GB/T 19501 : 2013 MICROBEAM ANALYSIS - GENERAL GUIDE FOR ELECTRON BACKSCATTER DIFFRACTION ANALYSIS
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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