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EN 62132-4:2006

Current
Current

The latest, up-to-date edition.

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
Published date

05-19-2006

1 Scope
2 Normative references
3 Terms and definitions
4 General
  4.1 Measurement basics
  4.2 Single pin direct power injection
  4.3 Multiple pin direct power injection into
      pins of differential mode systems
5 Test conditions
6 Test equipment
  6.1 General
  6.2 RF power source
  6.3 RF power meter and directional coupler
7 Test set-up
  7.1 General
  7.2 Power injection set-up
  7.3 Test circuit board
  7.4 Characteristics of the power injection set-up
  7.5 Decoupling networks
8 Test procedure
  8.1 General
  8.2 Specific test procedure
9 Test report
Annex A (informative) Example of a specification of immunity
                       levels e.g. for automotive applications
Annex B (informative) Hints for the best installation of a
                       test set-up with respect to RF
Annex C (informative) Constant peak test level explanation
Annex ZA (normative) Normative references to international
                       publications with their corresponding
                       European publications
Bibliography

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

Committee
CLC/SR 47A
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

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EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
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EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
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EN 61967-4 : 2002 COR 2017 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
ISO 11452-2:2004 Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 2: Absorber-lined shielded enclosure
ISO 11452-1:2015 Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 1: General principles and terminology
ISO 11452-5:2002 Road vehicles — Component test methods for electrical disturbances from narrowband radiated electromagnetic energy — Part 5: Stripline
ISO 11451-2:2015 Road vehicles Vehicle test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 2: Off-vehicle radiation sources
ISO 11452-7:2003 Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 7: Direct radio frequency (RF) power injection
ISO 11451-4:2013 Road vehicles Vehicle test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 4: Bulk current injection (BCI)
ISO 11451-1:2015 Road vehicles Vehicle test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 1: General principles and terminology

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