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HD 323.2.2 : 200S1

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST B: DRY HEAT
Superseded date

03-01-1993

Published date

01-12-2013

DocumentType
Standard
PublisherName
Harmonization Documents
Status
Superseded
Supersedes

Standards Relationship
DIN IEC 60068-2-2:1980-03 Identical
UNE 20501-2-2:1978 Identical
IEC 60068-2-2a:1976 Identical
DIN IEC 60068-2-2:1980-03 Corresponds

BS EN 60068-3-7:2002 Environmental testing. Guidance Measurements in temperature chambers for tests A and B (with load)
CEI EN 60068-3-7 : 2002 ENVIRONMENTAL TESTING - PART 3-7: SUPPORTING DOCUMENTATION AND GUIDANCE MEASUREMENTS IN TEMPERATURE CHAMBERS FOR TEST A AND B (WITH LOAD)
BS 3535-1:1990 Isolating transformers and safety isolating transformers General requirements
EN 60747-5-2:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
EN 60835-1-1:1992 Methods of measurement for equipment used in digital microwave radio transmission systems - Part 1: Measurements common to terrestrial radio-relay systems and satellite earth stations - Section 1: General
I.S. EN 60835-1-1:1993 METHODS OF MEASUREMENT FOR EQUIPMENT USED IN DIGITAL MICROWAVE RADIO TRANSMISSION SYSTEMS - PART 1: MEASUREMENTS COMMON TO TERRESTRIAL RADIO-RELAY SYSTEMS AND SATELLITE EARTH STATIONS - SECTION ONE: GENERAL
I.S. EN 60068-3-7:2002 ENVIRONMENTAL TESTING - PART 3-7: SUPPORTING DOCUMENTATION AND GUIDANCE - MEASUREMENTS IN TEMPERATURE CHAMBERS FOR TESTS A AND B (WITH LOAD)
BS EN 60835-1-1:1994 Methods of measurement for equipment used in digital microwave radio transmission systems. Measurements common to terrestrial radio-relay systems and satellite earth stations General
CEI EN 60747-5-2 : 2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
EN 60068-3-7:2002 Environmental testing - Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load)
BS EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
CEI EN 60835-1-1 : 1996 METHODS OF MEASUREMENT FOR EQUIPMENT USED IN DIGITAL MICROWAVE RADIO TRANSMISSION SYSTEMS - PART 1: MEASUREMENTS COMMON TO TERRESTRIAL RADIO-RELAY SYSTEMS AND SATELLITE EARTH STATIONS - SECTION 1: GENERAL
IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
NF EN 60835 1-1 : 1993 METHODS OF MEASUREMENT FOR EQUIPMENT USED IN DIGITAL MICROWAVE RADIO TRANSMISSION SYSTEMS - PART 1: MEASUREMENTS COMMON TO TERRESTRIAL RADIO-RELAY SYSTEMS AND SATELLITE EARTH STATIONS - SECTION ONE: GENERAL

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