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I.S. EN 62433-3:2017

I.S. EN 62433-3:2017

Current

Current

The latest, up-to-date edition.

EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEM-RE)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2017

Publisher

National Standards Authority of Ireland

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-RE macro-model description
6 REML format
7 Extraction
8 Validation
Annex A (normative) - Preliminary definitions for XML
        representation
Annex B (informative) - Electromagnetic fields radiated
        by an elementary electric and magnetic dipole
Annex C (informative) - Example files
Annex D (normative) - REML valid keywords and usage
Annex E (informative) - ICEM-RE extraction methods
Annex F (informative) - ICEM-RE model validation examples
Annex G (informative) - ICEM-RE macro-model usage examples
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC).

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (06/2017)
DocumentType
Standard
Pages
196
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 62433-3:2017 Identical

IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework

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Hardcopy - English
PDF - English
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