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IEC 60362:1971

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Guide for the collection of reliability, availability, and maintainability data from field performance of electronic items
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

07-23-2013

Language(s)

English - French

Published date

01-01-1971

Provides recommendations for the collection of reliability data relating to the field performance of electronic items. It provides for the acquisition of data sufficiently comprehensive to permit detailed failure and failure-rate analysis of items operating under various conditions: time, environment, storage, stand-by, repair, etc.

DocumentType
Standard
Pages
21
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
UTEC 20 313 : 1981 Identical
NEN NPR 10362 : 1977 Identical
AS 2529-1982 Identical
UNE 20512-5:1976 Identical

MIL-HDBK-470 Revision A:1997 DESIGNING AND DEVELOPING MAINTAINABLE PRODUCTS AND SYSTEMS - VOLUME 1
IEC 61070:1991 Compliance test procedures for steady-state availability
IEC 60571-3:1990 Electronic equipment used on rail vehicles. Part 3: Components, programmable electronic equipment and electronic system reliability
CEI 56-32 : 2000 COMPLIANCE TEST PROCEDURES FOR STEADY-STATE AVAILABILITY
IEC 60571-1:1990 Electronic equipment used on rail vehicles. Part 1: General requirements and tests for electronic equipment
BS 4200-3:1979 Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts)
BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
BS CECC 23200-003:1991 Specification for harmonized system of quality assessment for electronic components: capability detail specification: single and double sided printed boards with plated-through holes

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