IEC 60747-6:2016
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Part 6: Discrete devices - Thyristors
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
04-13-2016
Publisher
IEC 60747-6:2016 provides standards for the following types of discrete semiconductor devices:
- reverse-blocking triode thyristors;
- reverse-conducting (triode) thyristors;
- bidirectional triodethyristors (triacs);
- turn-off thyristors.
This edition includes the following significant technical changes with respect to the previous edition:
a) Clauses 3, 4, 5, 6, and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions;
b) some parts of Clause 8 and Clause 9 were moved and added to Clause 7 of this third edition;
c) Clause 8 and 9 were deleted in this third edition;
d) Annex A was deleted.
This publication is to be read in conjunction with IEC 60747-1:2006.
| Committee |
TC 47/SC 47E
|
| DevelopmentNote |
Supersedes IEC 60147-2A, IEC 60147-1C, IEC 60147-0A, IEC 60147-2H IEC 60147-2E, IEC 60147-2J and IEC 60147-1G. (07/2004) To be used in conjunction with IEC 60747-1. Stability date: 2020. (04/2016)
|
| DocumentType |
Standard
|
| Pages |
254
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| AS 2547.1.6-1986 | Identical |
| BS IEC 60747-6:2016 | Identical |
| NEN IEC 60747-6 : 2016 | Identical |
| PN IEC 60747-6 : 2004 | Identical |
| DIN IEC 60747-6:1987-06 | Identical |
| NFC 96 006 : 1984 | Identical |
| BS 6493-1.6:1984 | Identical |
| BS EN 153000:1998 | Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
| I.S. EN 60749-34:2010 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
| BS EN 60749-34:2010 | Semiconductor devices. Mechanical and climatic test methods Power cycling |
| CEI EN 60747-15 : 2012 | SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
| IEC 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
| EN 153000:1998 | Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval) |
| EN 60747-15:2012 | Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
| EN 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
| BS EN 60700-2:2016 | Thyristor valves for high voltage direct current (HVDC) power transmission Terminology |
| CEI EN 61643-341 : 2002 | COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS) |
| I.S. EN 60747-15:2012 | SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES (IEC 60747-15:2010 (EQV)) |
| BS IEC 60747-9:2007 | Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs) |
| DIN EN 12977-5:2016-08 (Draft) | THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT |
| I.S. EN 60700-2:2016 | THYRISTOR VALVES FOR HIGH VOLTAGE DIRECT CURRENT (HVDC) POWER TRANSMISSION - PART 2: TERMINOLOGY |
| IEC 60747-9:2007 | Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs) |
| I.S. EN 153000:1998 | DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION) |
| I.S. EN 61803:1999 | DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE COMMUTATED CONVERTERS |
| 09/30209939 DC : 0 | BS EN 60749-34 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
| 07/30162213 DC : 0 | BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
| BS EN 61803 : 1999 | DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE-COMMUTATED CONVERTERS (IEC 61803:1999) |
| CEI EN 61803 : 2011 | DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS |
| 11/30247849 DC : 0 | BS EN 12977-5 - THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT |
| CEI EN 60749-34 : 2012 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
| BS EN 60747-15:2012 | Semiconductor devices. Discrete devices Isolated power semiconductor devices |
| 17/30343732 DC : 0 | BS EN 60747-9 - SEMICONDUCTOR DEVICES - PART 9: DISCRETE DEVICES - INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS) |
| 17/30357121 DC : 0 | PD IEC/TS 60076-23 ED.1.0 - POWER TRANSFORMERS - PART 23: SUPPRESSION DEVICES OF DC MAGNETIC BIAS OF ELECTRIC POWER TRANSFORMERS |
| BS EN 60633 : 1999 | TERMINOLOGY FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) TRANSMISSION |
| UNI EN 12977-5 : 2012 | THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT |
| NF EN 61803 : 2000 AMD 2 2017 | DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE-COMMUTATED CONVERTERS |
| IEC 60633:1998+AMD1:2009+AMD2:2015 CSV | Terminology for high-voltage direct current (HVDC) transmission |
| EN 61643-341:2001 | Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
| DIN VDE 0558-1 : 1987 | SEMICONDUCTOR CONVERTORS - GENERAL SPECIFICATIONS AND PARTICULAR SPECIFICATIONS FOR LINE-COMMUTATED CONVERTORS |
| 14/30281809 DC : 0 | BS EN 60700-2 - THYRISTOR VALVES FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) POWER TRANSMISSION - PART 2: TERMINOLOGY |
| BS EN 61643-341:2001 | Low voltage surge protective devices Specification for thyristor surge suppressors (TSS) |
| 04/30114936 DC : DRAFT JUN 2004 | EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES |
| 09/30206330 DC : 0 | BS EN 61803:1999+A1 - DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS |
| BS EN 12977-5:2012 | Thermal solar systems and components. Custom built systems Performance test methods for control equipment |
| EN 12977-5:2018 | Thermal solar systems and components - Custom built systems - Part 5: Performance test methods for control equipment |
| EN 60700-2:2016/AC:2017-07 | THYRISTOR VALVES FOR HIGH VOLTAGE DIRECT CURRENT (HVDC) POWER TRANSMISSION - PART 2: TERMINOLOGY (IEC 60700-2:2016/COR1:2017) |
| EN 61803:1999/A2:2016 | DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE COMMUTATED CONVERTERS (IEC 61803:1999/A2:2016) |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
| UNE-EN 60749-34:2011 | Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling |
| IEC 61803:1999+AMD1:2010+AMD2:2016 CSV | Determination of power losses in high-voltage direct current (HVDC)converter stations with line-commutated converters |
| I.S. EN 12977-5:2012 | THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
| I.S. EN 60633:1999 | TERMINOLOGY FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) TRANSMISSION |
| EN 60633:1999/A2:2015 | TERMINOLOGY FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) TRANSMISSION (IEC 60633:1998/A2:2015) |
| IEC 61643-341:2001 | Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
| IEC 60747-15:2010 | Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
| DIN EN 12977-5:2012-06 | THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT |
| IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| IEC 60050-113:2011 | International Electrotechnical Vocabulary (IEV) - Part 113: Physics for electrotechnology |
| IEC 60749-23:2004+AMD1:2011 CSV | Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life |
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Hardcopy - English - French
PDF - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
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