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IEC 60747-8-4:2004

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

01-13-2014

Language(s)

English - French

Published date

09-24-2004

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
  3.1 General terms
  3.2 Equivalent circuit
  3.3 Terms related to ratings and characteristics
  3.4 Conventional used terms
4 Letter symbols
  4.1 Additional general subscripts
  4.2 List of additional letter symbols
5 Essential ratings and characteristics
  5.1 General
  5.2 Ratings (limiting values)
  5.3 Characteristics
6 Measuring methods
  6.1 General
  6.2 Verification of ratings (limiting values)
  6.3 Methods of measurement
7 Acceptance and reliability (revised from Clause 7 of
  IEC 60747-8)
  7.1 Endurance and reliability tests, and test methods
  7.2 Type tests and routine tests
Bibliography

Gives details for the following categories of metal-oxide semiconductor field-effect transistors (MOSFETs) with inverse diodes:type B depletion (normally on) type and Type C enhancement (normally off) type.

DevelopmentNote
Stability Date: 2013. (10/2012)
DocumentType
Standard
Pages
121
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN IEC 60747-8-4 : 2004 Identical
BS IEC 60747-8-4:2004 Identical

IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC PAS 62180:2000 Electrostatic discharge (ESD) sensitivity testing machine model (MM)
IEC 60747-9:2007 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
IEC 60747-8:2010 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

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