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IEC 60748-2-1:1991

Current
Current

The latest, up-to-date edition.

Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Russian

Published date

10-01-1991

FOREWORD
INTRODUCTION
1 Marking and ordering information
2 Application related description
3 Specification of the function
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified operating
   temperature range)
6 Electrical characteristics
7 Programming
8 Mechanical and climatic ratings, characteristics and data
9 Additional information
10 Screening
11 Quality assessment procedures
12 Structural similarity procedures
13 Test conditions and inspection requirements
14 Additional measurement method

DevelopmentNote
Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
DocumentType
Standard
Pages
31
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
BS QC 790132:1992 Identical

EN 60747-16-4:2004/A2:2017 SEMICONDUCTOR DEVICES - PART 16-4: MICROWAVE INTEGRATED CIRCUITS - SWITCHES (IEC 60747-16-4:2004/A2:2017)
IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
I.S. EN 60747-16-4:2004 SEMICONDUCTOR DEVICES - PART 16-4: MICROWAVE INTEGRATED CIRCUITS - SWITCHES

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