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IEC 60749-2:2002

Current
Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Published date

04-12-2002

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V.This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.The contents of the corrigendum of August 2003 have been included in this copy.

Committee
TC 47
DevelopmentNote
Supersedes IEC 60749. (03/2008) Stability Date: 20121. (11/2017)
DocumentType
Standard
Pages
11
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
NF EN 60749-2 : 2002 Identical
NEN EN IEC 60749-2 : 2002 Identical
I.S. EN 60749-2:2002 Identical
PN EN 60749-2 : 2004 Identical
BS EN 60749-2:2002 Identical
CEI EN 60749-2 : 2004 Identical
EN 60749-2:2002 Identical
DIN EN 60749-2:2003-04 Identical
UNE-EN 60749-2:2003 Identical

17/30355772 DC : 0 BS EN 62047-33 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 33: MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE
13/30264591 DC : 0 BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR
13/30264600 DC : 0 BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID
13/30264596 DC : 0 BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER

IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure

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