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IEC 61178-1:1993

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

08-09-2002

Language(s)

English - French

Published date

03-31-1993

Publisher

International Electrotechnical Committee

FOREWORD
1 General
    1.1 Scope
    1.2 Normative references
2 Technical
    2.1 Order of precedence
    2.2 Units, symbols and terminology
    2.3 Preferred ratings and characteristics
    2.4 Marking
3 Quality assessment procedures
    3.1 Primary stage of manufacture
    3.2 Structurally similar components
    3.3 Subcontracting
    3.4 Manufacturer's approval
    3.5 Approval procedures
    3.6 Procedures for capability approval
    3.7 Procedures for qualification approval
    3.8 Test procedures
    3.9 Screening requirements
    3.10 Rework and repair work
    3.11 Certified test records
    3.12 Delayed delivery
    3.13 Release for delivery
    3.14 Unchecked parameters
4 Test and measurement procedures
    4.1 General
    4.2 Alternative test methods
    4.3 Precision of measurement
    4.4 Standard conditions for testing
    4.5 Visual inspection
    4.6 Dimensioning and gauging procedures
    4.7 Electrical test procedures
          4.7.1 Frequency and resonance resistance
          4.7.2 Drive level dependency
          4.7.3 Frequency and resonance resistance as
                  a function of temperature
          4.7.4 Unwanted responses
          4.7.5 Shunt capacitance
          4.7.6 Load resonance frequency and resistance
          4.7.7 Frequency pulling range (fL1.L2)
          4.7.8 Motional parameters
          4.7.9 Insulation resistance
    4.8 Mechanical and environmental test procedures
          4.8.1 Robustness of terminations (destructive)
          4.8.2 Sealing tests (non destructive)
          4.8.3 Soldering (solderability and resistance to
                  soldering heat)
          4.8.4 Rapid change of temperature, two-fluid bath
                  method (non destructive)
          4.8.5 Rapid change of temperature with prescribed
                  time of transition (non destructive)
          4.8.6 Bump (destructive)
          4.8.7 Vibration (destructive)
          4.8.8 Shock (destructive)
          4.8.9 Free fall (destructive)
          4.8.10 Acceleration, steady state (non destructive)
          4.8.11 Dry heat (non destructive)
          4.8.12 Damp heat, cyclic (destructive)
          4.8.13 Cold (non destructive)
          4.8.14 Climatic sequence (destructive)
          4.8.15 Dampheat, steady state (destructive)
    4.9 Endurance test procedure
          4.9.1 Ageing (non destructive)
          4.9.2 Extended ageing (non destructive)

Specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures according to clause 11 of IECQ 001002.

Committee
TC 49
DevelopmentNote
Supersedes IEC 122 PT1 (03/2001)
DocumentType
Standard
Pages
61
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN IEC 61178-1 : 1999 Identical
DIN IEC 61178-1:1995-02 Identical

CEI EN 60368-4 : 2003 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 4: SECTIONAL SPECIFICATION - CAPABILITY APPROVAL
05/30132097 DC : DRAFT JUNE 2005 IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
I.S. HD 60027-2:2003 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
I.S. EN 60368-1:2000 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 60368-4:2001 Piezoelectric filters Sectional specification. Capability approval
13/30278807 DC : 0 BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
BS EN 60368-1:2000 Piezoelectric filters Generic specification
CEI EN 60368-1 : 2006 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 61178-3-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
HD 60027-2 : 200S1 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
IEC 61178-2-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
BS EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
NFC 03 002 : 2002 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
IEC 60368-4:2000 Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 60368-4:2000 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval

IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
IEC GUIDE 102:1996 Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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Hardcopy - English - French
PDF - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
PDF 9 Users - English - French
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