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IEC 61435:2013

Current
Current

The latest, up-to-date edition.

Nuclear instrumentation - High-purity germanium crystals for radiation detectors - Measurement methods of basic characteristics
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

08-12-2013

FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms, definitions, symbols and abbreviations
4 Measurement of net electrically-active impurity
  concentrations
5 Deep level transient spectroscopy for the determination
  of impurity-centre concentration
6 Crystallographic properties
Annex A (informative) - The Hall factor for n-type
        and p-type HPGe
Annex B (informative) - Function f(R[AB,CD]/R[BC,DA)
        versus R[AB,CD]/R[BC,DA]
Bibliography

IEC 61435:2013(E) is applicable to high-purity germanium crystals used for radiation detectors for gamma-rays and X-rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3. This International Standard specifies terminology and test methods for measurements of basic characteristics of high-purity germanium crystals. Test methods for completed assembled germanium detectors are given in IEC 60973 and IEC 60759. The main technical changes with regard to the previous edition are as follows:
- review the existing requirements;
- update the terminology and definitions.

Committee
TC 45
DevelopmentNote
Stability date: 2020. (08/2013)
DocumentType
Standard
Pages
32
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
BS IEC 61435:2013 Identical
NEN IEC 61435 : 2013 Identical

IEC 60050-394:2007 International Electrotechnical Vocabulary (IEV) - Part 394: Nuclear instrumentation - Instruments, systems, equipment and detectors
IEC 60973:1989 Test procedures for germanium gamma-ray detectors
IEC 60050-121:1998 International Electrotechnical Vocabulary (IEV) - Part 121: Electromagnetism
IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
IEC 60050-393:2003 International Electrotechnical Vocabulary (IEV) - Part 393: Nuclear instrumentation - Physical phenomena and basic concepts

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