Plasma display panels - Part 5: Generic specification

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

11-25-2009

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Normative references
3 Order of precedence
4 Terminology, units, symbols and abbreviations
5 Standard environmental conditions
6 Marking
7 Quality assessment procedures
8 Qualification approval procedure
9 Capability approval procedures
10 Test and measurement procedures
Annex A (normative) - Lot tolerance percentage defective
(LTPD) sampling plans
Annex B (informative) - General description of specifications

IEC 61988-5:2009 is a generic specification for plasma display panels specifies general procedures for quality assessment to be used in the IECQ System and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.

Committee	TC 110
DevelopmentNote	Stability Date: 2021. (09/2017)
DocumentType	Standard
Pages	46
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NF EN 61988-5 : 2010	Identical
NBN EN 61988-5 : 2010	Identical
NEN EN IEC 61988-5 : 2010	Identical
I.S. EN 61988-5:2009	Identical
PN EN 61988-5 : 2010	Identical
UNE-EN 61988-5:2009	Identical
BS EN 61988-5:2009	Identical
CEI EN 61988-5 : 2011	Identical
EN 61988-5 : 2009	Identical
DIN EN 61988-5:2010-05	Identical

IEC 61988-1:2011	Plasma display panels - Part 1: Terminology and letter symbols
IEC 61988-2-1:2012	Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
IEC 61988-3-1:2005	Plasma display panels - Part 3-1: Mechanical interface
IEC Q 01 : 5.0	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
ISO 3534-2:2006	Statistics Vocabulary and symbols Part 2: Applied statistics
IEC 61988-4:2007	Plasma display panels - Part 4: Climatic and mechanical testing methods
ISO 2859-10:2006	Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 61988-2-2:2003	Plasma display panels - Part 2-2: Measuring methods - Optoelectrical

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IEC 61988-5:2009

Plasma display panels - Part 5: Generic specification

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

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