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IEC 62132-3:2007

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

12-31-2021

Language(s)

English - French

Published date

09-26-2007

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
  5.1 General
  5.2 Test equipment
  5.3 Test board
6 Test procedure
  6.1 Hazardous electromagnetic fields
  6.2 Calibration of forward power limitation
  6.3 BCI test
  6.4 BCI test set-up characterization procedure
7 Test report
Annex A (informative) Examples for test levels and frequency
                      step selection
Annex B (informative) Example of BCI test board and set-up
Annex C (informative) Example of RF test board and set-up
Bibliography

This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.

Committee
TC 47/SC 47A
DevelopmentNote
Stability Date: 2015. (10/2012)
DocumentType
Standard
Pages
37
PublisherName
International Electrotechnical Committee
Status
Withdrawn

Standards Relationship
NEN EN IEC 62132-3 : 2007 Identical
I.S. EN 62132-3:2007 Identical
PN EN 62132-3 : 2007 Identical
UNE-EN 62132-3:2007 Identical
BS EN 62132-3:2007 Identical
CEI EN 62132-3 : 2008 Identical
EN 62132-3 : 2007 Identical
NF EN 62132-3 : 2008 Identical
DIN EN 62132-3:2008-04 Identical

EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
I.S. EN 62132-1:2016 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
12/30268333 DC : 0 BS EN 62132-1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
16/30336986 DC : 0 BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS
EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

ISO 11452-4:2011 Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 4: Harness excitation methods
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
MIL-STD-461 Revision G:2015 REQUIREMENTS FOR THE CONTROL OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT

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Hardcopy - English - French
PDF - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
PDF 9 Users - English - French
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