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IEC 62215-3:2013

Current
Current

The latest, up-to-date edition.

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

07-17-2013

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

Committee
TC 47/SC 47A
DevelopmentNote
Stability date: 2021. (11/2017)
DocumentType
Standard
Pages
66
PublisherName
International Electrotechnical Committee
Status
Current

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