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IEC 62624:2009

Current
Current

The latest, up-to-date edition.

Test methods for measurement of electrical properties of carbon nanotubes
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

08-04-2009

Publisher

International Electrotechnical Committee

Foreword
IEEE Introduction
1 Overview
  1.1 Scope
  1.2 Purpose
  1.3 Electrical characterization overview
2 Definitions, acronyms, and abbreviations
  2.1 Definitions
  2.2 Acronyms and abbreviations
3 Nanotube properties
  3.1 Single-walled nanotube
  3.2 Multi-walled nanotube
4 Electrodes
  4.1 Materials
  4.2 Method for electrode fabrication
  4.3 Dimensions
5 Device characterization
  5.1 Architecture design
  5.2 Method for processing and fabrication
  5.3 Standard characterization procedures
  5.4 Environmental control and standards
Annex A (informative) Bibliography
Annex B (informative) List of Participants

IEC 62624:2009(E) (IEEE 1650:2005) provides methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNTs.

DevelopmentNote
Also numbered as IEEE 1650. (08/2009) Stability Date: 2017. (12/2017)
DocumentType
Standard
Pages
17
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
DIN IEC 62624:2010-10 Identical
GOST R IEC 62624 : 2013 Identical
NEN IEC 62624 : 2009 Identical

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IEC TS 62607-2-1:2012 Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
IEC PAS 62565-2-1:2011 Nanomanufacturing - Material specifications - Part 2-1: Single-wall carbon nanotubes - Blank detail specification

SEMI E89 : 2007(R2013) GUIDE FOR MEASUREMENT SYSTEM ANALYSIS (MSA)

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
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