Test methods for the characterization of organic transistor-based ring oscillators

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

08-05-2013

Publisher

International Electrotechnical Committee

1. Overview
2. Definitions, abbreviations and acronyms
3. Standard ring oscillator characterization
procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants

IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator

DevelopmentNote	Also numbered as IEEE 1620.1. (08/2013)
DocumentType	Standard
Pages	20
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
BS IEC 62860-1:2013	Identical
BS EN 62341-1-1:2009	Identical

IEEE 1139-2008

IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities

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IEC 62860-1:2013

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