Test methods for the characterization of organic transistors and materials

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

08-05-2013

Publisher

International Electrotechnical Committee

1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants

IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor

DevelopmentNote	Also numbered as IEEE 1620. (08/2013)
DocumentType	Standard
ISBN	978-2-8322-1014-7
Pages	23
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NEN IEC 62860 : 2013	Identical
BS IEC 62860:2013	Identical

17/30336222 DC : 0	BS EN 62899-203 - PRINTED ELECTRONICS - PART 203 - MATERIALS - SEMICONDUCTOR INK
PD IEC/TS 62607-5-1:2014	Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Carrier transport measurements
IEC TS 62607-5-1:2014	Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements

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IEC 62860:2013

Test methods for the characterization of organic transistors and materials

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referenced By This Book

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