IEC 62899-503-1:2020
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Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
05-27-2020
Publisher
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
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