Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

12-14-2015

Publisher

International Electrotechnical Committee

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

DevelopmentNote	Also numbered as IEEE 1505.1. (12/2015)
DocumentType	Standard
Pages	162
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NEN IEC 63003 : 2016	Identical
BS IEC 63003:2015	Identical

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