IEC TR 61967-4-1:2005
Current
The latest, up-to-date edition.
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
02-07-2005
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Splitting ICs into IC function modules
4.1 Background
4.2 Benefits
4.3 IC function modules
4.4 Example matrix for splitting ICs into IC function
modules
5 Workflow to perform IC EMC emission tests
5.1 Emission test philosophy
5.2 Flowchart of performing emission tests
6 Test configurations for IC function modules
6.1 EMC test recommendations for IC function modules
6.2 Port selection guide
6.3 Test networks at selected ports
6.4 Supply selection guide
6.5 Test networks at selected supplies
6.6 Parameter initialization of IC function modules
for testing
6.7 Test parameter for performing conducted emission
measurements
7 Test board layout recommendations
7.1 Common test board recommendations
7.2 150 ohm network on 2 layer and multi layer PCB
7.3 1 ohm network on 2 layer and multi-layer PCB
8 Test report
Annex A (normative) IEC 61967-4 test network modification
Annex B (informative) Trace impedance calculation
Annex C (informative) Examples for splitting ICs into IC
function modules
Figures
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