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IEC TR 63133:2017

Current
Current

The latest, up-to-date edition.

Semiconductor devices - Scan based ageing level estimation for semiconductor devices
Published date

10-11-2017

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Ageing level
Bibliography

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Committee
TC 47
DevelopmentNote
Stability Date: 2022. (10/2017)
DocumentType
Technical Report
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
PD IEC/TR 63133:2017 Identical

IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

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