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IEEE 1149.6-2003

IEEE 1149.6-2003

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks

Available format(s)

PDF

Superseded date

07-20-2021

Language(s)

English

Published date

04-17-2003

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions and acronyms
4 Technology
5 Instructions
6 Pin implementation specifications
7 Conformance and documentation requirements
Annex A (informative) - Applications and tools
Annex B (informative) - Noise rejection in
        edge-detecting mode
Annex C (informative) - Advanced I/O
        boundary-scan register cells
Annex D (informative) - Test receiver design
        examples
Annex E (informative) - A proposed 'INITIALIZE'
        instruction
Annex F (informative) - Bibliography

Specifies extensions to IEEE Std 1149.1[TM] to standardize the boundary-scan structures and methods required to help ensure simple, robust, and minimally intrusive boundary-scan testing of advanced digital networks.

Committee
Test Technology
DocumentType
Standard
Pages
140
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy

DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
IEEE 1149.8.1-2012 IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
IEEE C62.42.0-2016 IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Overview
IEEE 1687-2014 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

IEEE 1149.8.1-2012 IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

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