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IEEE 1149.8.1-2012

IEEE 1149.8.1-2012

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components

Available format(s)

PDF

Withdrawn date

03-30-2023

Language(s)

English

Published date

08-09-2012

Publisher

Institute of Electrical & Electronics Engineers

1. Overview
2. Normative references
3. Definitions
4. Technology
5. Instructions
6. Pin implementation specifications
7. Toggle_Control register
8. Conformance and documentation requirements
Annex A (informative) - Unpowered testing for open
        connections on printed circuit assemblies
Annex B (informative) - Boundary register cells that
        support ST-pins and IEEE 1149.6 ac-pins
Annex C (informative) - Bibliography

Describes extensions to IEEE 1149.1[TM] that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.

Committee
Test Technology
DocumentType
Standard
ISBN
978-0-7381-7392-4
Pages
95
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn

DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
IEEE 1149.6-2003 IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

IEEE 1149.1-2001 IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE 1149.6-2003 IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

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PDF - English
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