IEEE 1445-1998

Name: IEEE 1445-1998
Brand: IEEE
Price: 154.44 USD

Superseded

View Superseded by

IEEE Standard for Digital Test Interchange Format (DTIF)

Available format(s)

PDF

Superseded date

10-19-2021

Language(s)

English

Published date

03-10-1999

Publisher

Institute of Electrical & Electronics Engineers

1. Overview
2. Normative references
3. Definitions, acronyms and abbreviations
4. Data organization overview of the DTIF
   standard environment
5. File type specifications
6. Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - Example of a circuit used in
        a test simulation
Annex C (informative) - Bibliography

Specifies DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing.

Committee	SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote	Supersedes IEEE DRAFT 1445. (11/1999)
DocumentType	Standard
Pages	108
PublisherName	Institute of Electrical & Electronics Engineers
Status	Superseded
SupersededBy	IEEE 1445-2016 IEEE 1023-2004 REDLINE
Supersedes	IEEE DRAFT 1445 : JUL 98

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