Name: IEEE 1450.6.2-2014
Brand: IEEE
Price: 167.51 USD

IEEE Standard for Memory Modeling in Core Test Language

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

06-13-2014

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Extensions to IEEE Std 1450.6-2005
5 MemoryRepairblock
6 MemoryPhysicalOrganizationblock
7 Memory CTL Orientation and Capabilities Tutorial

SoC test requires reuse of test data and test structures developed for individual cores (designs) when integrated into larger integrated circuits.

Committee	Test Technology
DocumentType	Standard
ISBN	978-0-7381-8972-7
Pages	74
PublisherName	Institute of Electrical & Electronics Engineers
Status	Current

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IEEE 1450.1-2005	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
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IEEE 1450 : 2007	STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA
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