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IEEE 1671.2-2012

IEEE 1671.2-2012

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description

Available format(s)

PDF , Hardcopy

Withdrawn date

03-30-2023

Language(s)

English

Published date

02-15-2013

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 InstrumentDescription schema
5 InstrumentDescription instance schema
6 ATML InstrumentDescription XML schema names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download Web site material
                        associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography

This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote
Also numbered as IEC 61671-2. (04/2016)
DocumentType
Standard
ISBN
978-0-7381-8144-8
Pages
52
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn
Supersedes

DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
IEEE 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
IEC 60488-2:2004 Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands
IEEE 802.3-2012 IEEE Standard for Ethernet
IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
IEEE 1671-2010 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
MIL-PRF-55310 Revision E:2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT

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PDF - English
Hardcopy - English
PDF - English
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