Name: IEEE 1687-2014
Brand: IEEE
Price: 336.20 USD

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

12-05-2014

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Technology
5 Hardware architecture
6 Instrument Connectivity Language (ICL)
7 Procedural Description Language (PDL): level-0
8 Procedural Description Language: level-1 (Tcl)
Annex A (informative) - ICL grammar
Annex B (informative) - PDL level-0 grammar
Annex C (informative) - PDL level-1 grammar
Annex D (informative) - PDL differences between
IEEE Std 1687-2014 and IEEE Std 1149.1-2013
Annex E (informative) - Examples
Annex F (informative) - Design guidance
Annex G (informative) - Bibliography

This standard develops a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and additional signals that may be required.

Committee	Test Technology
DocumentType	Standard
ISBN	978-0-7381-9416-5
Pages	283
PublisherName	Institute of Electrical & Electronics Engineers
Status	Current

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IEEE 1687-2014

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