Changes/Revisions to ISO/IEC 8802-3: 1993 [ANSI/IEEE Std
802.3, 1993 Edition]
Revisions to IEEE Std 1802.3-1991
1.3 Acronyms and Abbreviations
1.8 References
6. Type 10BASE-T MAU Conformance Test Methodology
6.1 Scope of 10BASE-T MAU Conformance Test
6.1.1 Embedded MAUs
6.2 10BASE-T MAU Abstract Test Suite
6.2.1 Capability and Behavior Tests
6.2.1.1 Test Group 1411.01 - Transmit Functions
6.2.1.2 Test Group 1411.02 - Receive Functions
6.2.1.3 Test Group 1411.03 - Loopback Functions
6.2.1.4 Test Group 1411.04 - Collision Functions
6.2.1.5 Test Group 1411.05 - SQE Test Functions
6.2.1.6 Test Group 1411.06 - Jabber Functions
6.2.1.7 Test Group 1411.07 - Link Integrity Test Functions
6.2.1.8 Test Group 1411.08 - MAU State Machines
6.2.1.9 Test Group 1411.09 - Isolation Requirements
6.2.1.10 Test Group 1411.10 - Transmitter Specification
6.2.1.11 Test Group 1411.11 - Receiver Specification
6.2.1.12 Test Group 1411.12 - AUI Signal Characteristics
6.2.1.13 Test Group 1411.13 - DI and CI Driver
                              Characteristics
6.2.1.14 Test Group 1411.14 - DO Receiver Characteristics
6.2.1.15 Test Group 1411.15 - Power Consumption
6.2.1.16 Test Group 1411.16 - Circuit Termination
6.2.1.17 Test Group 1411.17 - Safety Requirements
6.2.2 Basic Interconnection Test Group
6.2.2.1 Test Group 1411.18 - Mechanical Characteristics,
                              MDI
6.2.2.2 Test Group 1411.19 - Mechanical Characteristics,
                              AUI
6.3 Test Setups, Signals, and Adaptors Description
6.3.1 Test Signal Definitions
6.3.2 Common Test Setups
6.3.3 Special Test Adapters
6.3.3.1 Test Loads
6.3.3.2 Twisted-Pair Model (TPM)
6.3.3.3 100 ohm to 50 ohm Balun Impedance Adapter (BAL1)
6.3.3.4 100 ohm to 100 ohm TPM Balun (BAL2)
6.3.3.5 78 ohm to 50 ohm AUI Balun (BAL3)
6.3.3.6 78 ohm to 100 ohm Balun (BAL4)
6.3.3.7 78 ohm Balanced-to-Balanced 1:1 Center Tapped
         Transformer
6.3.3.8 Tester MAU1
6.3.3.9 Tester MAU2
6.3.3.10 30 Hz to 40 kHz Filter (FIL1)
6.3.3.11 40 kHz to BR Filter (FIL2)
6.3.4 Test Equipment Capabilities
6.3.4.1 Power Supply
6.3.4.2 Test Pattern Generator (TPG)
6.3.4.3 Link Test Pulse Generator (LTPG)
6.3.4.4 Arbitrary Waveform Generator (AWG)
6.3.4.5 Function Generator (FG)
6.3.4.6 Spectrum Analyzer
6.3.4.7 Network Analyzer
6.3.4.8 Oscilloscope
6.3.4.9 Differential Probe/Amplifier (DP)
6.3.4.10 High-Performance Differential Probe (HDP)
6.3.4.11 Current Probe/Amplifier (CP)
6.3.4.12 DC Ammeter
ANNEX
A. (informative) Reference Information
A1. Type 10BASE-T Mau
A1.1 State Diagram Test Coverage
A1.2 Test Signal to Test ID Cross-Reference
A1.3 Test Setup to Test ID Cross-Reference