Optics and photonics — Measurement method of semiconductor lasers for sensing

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

05-25-2018

Publisher

International Organization for Standardization

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Committee	ISO/TC 172/SC 9
DevelopmentNote	Supersedes ISO/DIS 17915 and ISO TS 17915. (05/2018)
DocumentType	Standard
Pages	29
PublisherName	International Organization for Standardization
Status	Current
Supersedes	ISO/TS 17915:2013

Standards	Relationship
BS ISO 17915:2018	Identical
NEN ISO 17915:2018	Identical

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