Customer Support: +1 416-401-8730

Login to i2i Subscription Intertek.com
  • There are no items in your cart
Please enter a keyword to search
Advanced search

ISO 22493:2014

Current
Current

The latest, up-to-date edition.

Microbeam analysis Scanning electron microscopy Vocabulary
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

04-09-2014

Publisher

International Organization for Standardization

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

DevelopmentNote
Supersedes ISO/DIS 22493. (04/2014)
DocumentType
Standard
Pages
20
PublisherName
International Organization for Standardization
Status
Current
Supersedes

Standards Relationship
BS ISO 22493:2014 Identical
NF ISO 22493 : 2009 Identical

15/30291643 DC : 0 BS ISO 18516 - SURFACE CHEMICAL ANALYSIS - DETERMINATION OF LATERAL RESOLUTION AND SHARPNESS IN BEAM BASED METHODS
ISO/TR 19319:2013 Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ISO/TS 10798:2011 Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
13/30290864 DC : 0 BS EN 16691 - WATER QUALITY - DETERMINATION OF POLYCYCLIC AROMATIC HYDROCARBONS (PAH) IN WHOLE WATER SAMPLES USING LIQUID SOLID EXTRACTION COMBINED WITH GAS CHROMATOGRAPHY MASS SPECTROMETRY (GC-MS)
16/30319120 DC : 0 BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS
ISO/TS 24597:2011 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
DD ISO/TS 10798 : DRAFT JULY 2011 NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
17/30328207 DC : DRAFT SEP 2017 BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
PD ISO/TR 19319:2013 Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary
ISO/TS 10797:2012 Nanotechnologies Characterization of single-wall carbon nanotubes using transmission electron microscopy
12/30245653 DC : 0 BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
XP ISO/TS 24597 : 2011 XP MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS OF EVALUATING IMAGE SHARPNESS
FD T16 203 : 2011 FD NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects

ISO 10241:1992 International terminology standards Preparation and layout
ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 704:2009 Terminology work — Principles and methods

View more information
US$150.00
Excluding Tax where applicable
USD
CAD
CHF
CNY
DKK
EUR
GBP
HKD
IDR
INR
JPY
KRW
MXN
NOK
NZD
SEK
SGD
USD
ZAR
Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us