Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

French, English

Published date

04-05-2013

Publisher

International Organization for Standardization

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

Committee	ISO/TC 202/SC 1
DevelopmentNote	Supersedes ISO/DIS 23833. (04/2013)
DocumentType	Standard
Pages	26
PublisherName	International Organization for Standardization
Status	Current
Supersedes	ISO 23833:2006

Standards	Relationship
NEN ISO 23833 : 2013	Identical
BS ISO 23833:2013	Identical
NF ISO 23833 : 2008	Identical

BS ISO 22493:2014	Microbeam analysis. Scanning electron microscopy. Vocabulary
DIN ISO 16592 E : 2015	MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - GUIDELINES FOR DETERMINING THE CARBON CONTENT OF STEELS USING A CALIBRATION CURVE METHOD (ISO 16592:2012)
ISO/TS 10798:2011	Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DIN ISO 15632:2015-11	Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN ISO 13067 E : 2015	MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE (ISO 13067:2011)
BS ISO 16592:2012	Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
NF ISO 13067 : 2012	MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE
ISO/TS 10797:2012	Nanotechnologies Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS ISO 11938:2012	Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
11/30199190 DC : 0	BS ISO 15632 - MICROBEAM ANALYSIS - INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS
10/30185165 DC : 0	BS ISO 11938 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - METHODS OF ELEMENTAL AREA ANALYSIS USING WAVELENGTH-DISPERSIVE SPECTROSCOPY
04/30122733 DC : DRAFT SEP 2004	BS ISO 22309 - MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY DISPERSIVE SPECTROMETRY (EDS)
BS ISO 13067:2011	Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 15632:2012	Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
DIN ISO 16592:2015-12	MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - GUIDELINES FOR DETERMINING THE CARBON CONTENT OF STEELS USING A CALIBRATION CURVE METHOD (ISO 16592:2012)
ISO 22493:2014	Microbeam analysis Scanning electron microscopy Vocabulary
DD ISO/TS 10798 : DRAFT JULY 2011	NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
BS ISO 15932:2013	Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22489:2016	Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
17/30328207 DC : DRAFT SEP 2017	BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS
04/30103951 DC : DRAFT JUN 2004
DIN ISO 13067:2015-12	Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
PD ISO/TS 10797:2012	Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
DIN ISO 15632 E : 2015	MICROBEAM ANALYSIS - SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS (ISO 15632:2012)
ISO 16592:2012	Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
ISO 13067:2011	Microbeam analysis Electron backscatter diffraction Measurement of average grain size
ISO 15932:2013	Microbeam analysis — Analytical electron microscopy — Vocabulary
ISO 22489:2016	Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
16/30296413 DC : 0	BS ISO 19463 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSER (EPMA) - GUIDELINES FOR PERFORMING QUALITY ASSURANCE PROCEDURES
12/30245653 DC : 0	BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
ISO 11938:2012	Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 15632:2012	Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

ISO 1087-1:2000	Terminology work Vocabulary Part 1: Theory and application
ISO 18115-1:2013	Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO/IEC Guide 99:2007	International vocabulary of metrology Basic and general concepts and associated terms (VIM)
ISO 18115-2:2013	Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
ISO 704:2009	Terminology work — Principles and methods
ISO 15632:2012	Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

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ISO 23833:2013

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