JEDEC JEP 138 : 1999
Current
Current
The latest, up-to-date edition.
USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
09-01-1999
Publisher
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
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