JEDEC JESD 35 A : 2001
Current
Current
The latest, up-to-date edition.
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS:
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
04-01-2001
Publisher
This document defines test procedures for the V-Ramp, J-Ramp and the Bounded J-Ramp oxide integrity tests.
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