Customer Support: +1 416-401-8730

Login to i2i Subscription Intertek.com
  • There are no items in your cart
Please enter a keyword to search
Advanced search
Home
JSA
JIS R 1637:1998

JIS R 1637:1998

Current

Current

The latest, up-to-date edition.

Test method for resistivity of conductive fine ceramic thin films with a four-point probe array

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

01-31-1998

Publisher

Japanese Standards Association

1 - 
2 - 
3 - 
4 - 
5 - 
6 - 
7 - 

This Japanese Industrial Standard specifies the test method for resistivity of the conductive fine ceramic thin films with a four-point array.

DocumentType
Test Method
Pages
0
PublisherName
Japanese Standards Association
Status
Current

Reaffirmed 2017

JIS Z 8401:1999 Guide to the rounding of numbers
JIS B 0651:2001 Geometrical Product Specification (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
JIS R 1600:1998 Glossary Of Terms Relating To Fine Ceramics
JIS R 1636:1998 Test method for thickness of fine ceramic thin films - Film thickness by contact probe profilometer

View more information
US$22.75
Excluding Tax where applicable
USD
CAD
CHF
CNY
DKK
EUR
GBP
HKD
IDR
INR
JPY
KRW
MXN
NOK
NZD
SEK
SGD
USD
ZAR
Hardcopy - Japanese
Hardcopy - English
PDF - English
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us