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JIS R 1640:2002

Current
Current

The latest, up-to-date edition.

Methods For The Quantitative Phase Analysis Of Silicon Nitride
Available format(s)

Hardcopy

Language(s)

Japanese

Published date

01-31-2002

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Current

2002 [20/01/2002]

JIS R 1600:1998 Glossary Of Terms Relating To Fine Ceramics
JIS Z 8401:1999 Guide to the rounding of numbers
JIS K 0131:1996 General rules for X-ray diffractometric analysis

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