NEN EN IEC 61967-4 : 2002 C1 2017
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 /150 DIRECT COUPLING METHOD
Published date
01-12-2013
Publisher
States a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1
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