NEN ISO 29301 : 2018
Current
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - METHODS FOR CALIBRATING IMAGE MAGNIFICATION BY USING REFERENCE MATERIALS WITH PERIODIC STRUCTURES
Published date
10-31-2018
Publisher
Defines a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM).
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