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PN EN 62226-3-1 : 2008 AMD 1 2017

Current
Current

The latest, up-to-date edition.

EXPOSURE TO ELECTRIC OR MAGNETIC FIELDS IN THE LOW AND INTERMEDIATE FREQUENCY RANGE - METHODS FOR CALCULATING THE CURRENT DENSITY AND INTERNAL ELECTRIC FIELD INDUCED IN THE HUMAN BODY - PART 3-1: EXPOSURE TO ELECTRIC FIELDS - ANALYTICAL AND 2D NUMERICAL MODELS
Published date

01-12-2013

Committee
TC 104
DocumentType
Standard
PublisherName
Polish Committee for Standardization
Status
Current

Standards Relationship
IEC 62226-3-1:2007+AMD1:2016 CSV Identical
EN 62226-3-1:2007/A1:2017 Identical

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