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SN EN 62132-4 : 2006

Current
Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD
Published date

01-12-2013

1 Scope
2 Normative references
3 Terms and definitions
4 General
  4.1 Measurement basics
  4.2 Single pin direct power injection
  4.3 Multiple pin direct power injection into
      pins of differential mode systems
5 Test conditions
6 Test equipment
  6.1 General
  6.2 RF power source
  6.3 RF power meter and directional coupler
7 Test set-up
  7.1 General
  7.2 Power injection set-up
  7.3 Test circuit board
  7.4 Characteristics of the power injection set-up
  7.5 Decoupling networks
8 Test procedure
  8.1 General
  8.2 Specific test procedure
9 Test report
Annex A (informative) Example of a specification of
                       immunity levels e.g. for
                       automotive applications
Annex B (informative) Hints for the best installation
                       of a test set-up with respect
                       to RF
Annex C (informative) Constant peak test level explanation
Annex ZA (normative) Normative references to international
                       publications with their corresponding
                       European publications
Bibliography

Specifies a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

DocumentType
Standard
PublisherName
Swiss Standards
Status
Current

Standards Relationship
DIN EN 62132-4:2006-10 Identical
EN 62132-4:2006 Identical
IEC 62132-4:2006 Identical
I.S. EN 62132-4:2006 Identical
BS EN 62132-4:2006 Identical

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