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TIA 455-127 : A2006(R2014)

Current
Current

The latest, up-to-date edition.

FOTP-127-A - BASIC SPECTRAL CHARACTERIZATION OF LASER DIODES
Published date

01-12-2013

Publisher

Telecommunications Industry Association

The intent of this test procedure is to measure the central wavelength, peak wavelength, and the spectral width (rms, MSTM, 15 dB down and FWHM) of a Multilongitudinal Mode (MLM) semiconductor laser diode using a dispersive spectrophotometric (using a revolving diffraction grating) method or other suitable methods.

Committee
FO-4.0
DocumentType
Standard
PublisherName
Telecommunications Industry Association
Status
Current

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