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    • Piezoelectric devices
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    IEC 61837-2:2018+AMD1:2020

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

    International Electrotechnical Committee

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    IEC 63041-3:2020

    Piezoelectric sensors – Part 3: Physical sensors

    International Electrotechnical Committee

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    IEC 63155:2020

    Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications

    International Electrotechnical Committee

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    IEC 62884-4:2019

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 4: Short-term frequency stability test methods

    International Electrotechnical Committee

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    IEC 62047-36:1.0

    Semiconductor devices – Micro-electromechanical devices – Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

    International Electrotechnical Committee

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    IEC 62047-34 : 1.0

    Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer

    International Electrotechnical Committee

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    IEC 62047-33:1.0

    Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device

    International Electrotechnical Committee

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    IEC 60122-4 : 2019

    Quartz crystal units of assessed quality – Part 4: Crystal units with thermistors

    International Electrotechnical Committee

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    IEC TS 61994-4-4 : 2018 ED 3.0

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

    International Electrotechnical Committee

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    IEC 62884-3 : 1ED 2018

    MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 3: FREQUENCY AGING TEST METHODS

    International Electrotechnical Committee

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